Cover Image: July 2003 Scientific American Magazine See Inside

Fine Focus [Preview]















Share on Tumblr

The image is striking: a tiny insect, magnified 10,000-fold, looms like a giant alien from a science-fiction movie, with terrifying talons and mandibles ready to devour the world. Thank the scanning electron microscope for the fascinating impression.

Scanning electron microscopes, or SEMs, enlarge objects up to one million times. But what makes their images so captivating is that they accurately portray the object's surface with resolutions finer than 100 angstroms. They can also indicate which atomic elements make up the sample.


This article was originally published with the title Fine Focus.



Subscribe     Buy This Issue

Already a Digital subscriber? Sign-in Now
If your institution has site license access, enter here.

Comments

Add Comment
Leave this field empty

Add a Comment

You must sign in or register as a ScientificAmerican.com member to submit a comment.
Click one of the buttons below to register using an existing Social Account.

More from Scientific American

See what we're tweeting about

Scientific American Editors

More »

Free Newsletters


Get the best from Scientific American in your inbox

Solve Innovation Challenges

Powered By: Innocentive

  SA Digital
  SA Digital

Science Jobs of the Week

Email this Article

Fine Focus: Scientific American Magazine

X
Scientific American Magazine

Subscribe Today

Save 66% off the cover price and get a free gift!

Learn More >>

X

Please Log In

Forgot: Password

X

Account Linking

Welcome, . Do you have an existing ScientificAmerican.com account?

Yes, please link my existing account with for quick, secure access.



Forgot Password?

No, I would like to create a new account with my profile information.

Create Account
X

Report Abuse

Are you sure?

X

Institutional Access

It has been identified that the institution you are trying to access this article from has institutional site license access to Scientific American on nature.com. To access this article in its entirety through site license access, click below.

Site license access
X

Error

X

Share this Article

X